组织机构
CRFM 2024 is organized by the Professional Committee of Electronic Metrology, Chinese Society for Measurement (CSM).
Electronic Metrology Committee
Director of the Committee
Prof.Cui Xiaohai,
National Institute of Metrology, China(IEEE Fellow), China
Research Field: RF power methodologies and the development of primary power standards from microwave to terahertz-wave.
Vice Director of the Committee
Prof. Miao Jungang
Beihang University, China
Prof. Ma Hongmei
Beijing Institute of Radio Metrology and Measurement, China
Prof. Si Liming
Beijing Institute of Technology, China
Prof. Wang Yong
The Fifth Electronics Research Institute of the Ministry of Industry and Information Technology, China
Prof Wei Ping
Chengdu Aircraft Industry (Group) Co., Ltd, China
General Secretary
Prof.Liu Yitong
National Institute of Metrology, China
Paper review expert
Prof. Nick Ridler
FIEEE, FIET, FInstP, CEng, CPhys NPL Fellow, UK.
Ph.D Arshad Selamat
Department of Electrical
Electronic and System Engineering
Universiti Kebangsaan Malaysia, Selangor, Malaysia
Prof Xifeng Lu
Communications Technology Laboratory, NIST Boulder, CO, US
Prof Yusong Meng
NMC, Singapore
Natalian Der
Teradyne, USA
Prof. Dazhen Gu
Communication Technology Lab National Institute of Standards and Technology Boulder, CO, USA
(Senior Member, IEEE)
Prof. Wang Guoan
University of South Carolina (IEEE Senior Member, IEEE Microwave and Wireless Components Letters Deputy Chief Editor)
Li Xiuping, Beijing University of Posts and Telecommunications
Prof. Su Jiangtao, Hangzhou Dianzi University, China
Prof. Lu Hongmei, Xidian University, China
Prof. Li Zhiping, Beihang University, China
Prof. Chen Wenhua, Tsinghua University, China
Prof. Qiao Liyan, Harbin Institute of Technology, China
Prof. Li Xiangjun, China Jiliang University, China
Prof. Zhou Haomiao, China Jiliang University, China
Prof. Zhao Ziran, Tsinghua University, China
Prof. Du Guanxiang, Nanjing University of Posts and Telecommunications, China
Prof. Yan Dong, Chongqing University of Posts and Telecommunications, China
Prof. Xiang Min, Chongqing University of Posts and Telecommunications, China
Prof. Huang Qingqing, Chongqing University of Posts and Telecommunications, China
Prof. Hu Kunzhi, Chongqing University of Posts and Telecommunications, China
Prof Zhu Jiangmiao, Beijing University Of Technology, China
Prof Yu Weihua, Beijing Institute of Technology, China
Prof Yang Chang, Beijing University of Posts and Telecommunications, China
Prof Gao Jinchun, Beijing University of Posts and Telecommunications, China
Prof Zhou Shaohu, Zhongyuan University of Technology, China
Prof Yan Yiming, Harbin Engineering University, China
Prof Gao Ju, Beijing University Of Technology, China
Prof Ding Shuai, University of Electronic Science and Technology of China, China
Prof Ren Jie, Beijing Jiaotong University, China
Prof Qi Zihang, Beijing University of Posts and Telecommunications, China
Prof Ding Hui, Capital Normal University, China
Prof Yang Chuntao Beijing Institute of Radio Metrology and Measurement
Prof Zhang Yichi, National Institute of Metrology, China
Prof Zhao Kejia, National Institute of Metrology, China
Prof Huang Pan, National Institute of Metrology, China
Prof Liu Xiao, National Institute of Metrology, China
Prof Lin Haoyu, National Institute of Metrology, China
Prof Li Difei, National Institute of Metrology, China
Prof He Zhao, National Institute of Metrology, China
Prof Meng Donglin, National Institute of Metrology, China
Publication editor
Xu Hao National Institute of Metrology, China
